Nicolas Rolland
Maître de conférences
CNU : SECTION 32 - CHIMIE ORGANIQUE, MINERALE, INDUSTRIELLE
Laboratoire / équipe
Publications
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"citationRef_s":"<i>Nature Communications</i>, 2023, 14, pp.4728. <a target=\"_blank\" href=\"https://dx.doi.org/10.1038/s41467-023-40376-w\">⟨10.1038/s41467-023-40376-w⟩</a>",
"citationFull_s":"Daniel Medina-Lopez, Thomas Liu, Silvio Osella, Hugo Levy-Falk, Nicolas Rolland, et al.. Interplay of structure and photophysics of individualized rod-shaped graphene quantum dots with up to 132 sp² carbon atoms. <i>Nature Communications</i>, 2023, 14, pp.4728. <a target=\"_blank\" href=\"https://dx.doi.org/10.1038/s41467-023-40376-w\">⟨10.1038/s41467-023-40376-w⟩</a>. <a target=\"_blank\" href=\"https://cnrs.hal.science/hal-04187762v1\">⟨hal-04187762⟩</a>",
"title_s":["Interplay of structure and photophysics of individualized rod-shaped graphene quantum dots with up to 132 sp² carbon atoms"],
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"citationRef_s":"<i>Journal of Physics and Chemistry of Solids</i>, 2022, 164, pp.110620. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.jpcs.2022.110620\">⟨10.1016/j.jpcs.2022.110620⟩</a>",
"citationFull_s":"F. Danoix, K. Hoummada, P. Maugis, N. Rolland, C. Debreux, et al.. Grain size effect on interfacial segregation in nanomaterials. <i>Journal of Physics and Chemistry of Solids</i>, 2022, 164, pp.110620. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.jpcs.2022.110620\">⟨10.1016/j.jpcs.2022.110620⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-03855610v1\">⟨hal-03855610⟩</a>",
"title_s":["Grain size effect on interfacial segregation in nanomaterials"],
"authFullName_s":["F. Danoix","K. Hoummada","P. Maugis","N. Rolland","C. Debreux","Didier Blavette"],
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"citationRef_s":"<i>Computer Physics Communications</i>, 2020, pp.107317. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.cpc.2020.107317\">⟨10.1016/j.cpc.2020.107317⟩</a>",
"citationFull_s":"Benjamin Klaes, Rodrigue Lardé, Fabien Delaroche, Stefan Parviainen, Nicolas Rolland, et al.. A model to predict image formation in the three-dimensional field ion microscope. <i>Computer Physics Communications</i>, 2020, pp.107317. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.cpc.2020.107317\">⟨10.1016/j.cpc.2020.107317⟩</a>. <a target=\"_blank\" href=\"https://normandie-univ.hal.science/hal-02571970v1\">⟨hal-02571970⟩</a>",
"title_s":["A model to predict image formation in the three-dimensional field ion microscope"],
"authFullName_s":["Benjamin Klaes","Rodrigue Lardé","Fabien Delaroche","Stefan Parviainen","Nicolas Rolland","Shyam Katnagallu","Baptiste Gault","François Vurpillot"],
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"citationRef_s":"<i>Scripta Materialia</i>, 2018, 148, pp.91 - 97. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.scriptamat.2017.05.012\">⟨10.1016/j.scriptamat.2017.05.012⟩</a>",
"citationFull_s":"J. Barnes, A. Grenier, I. Mouton, S. Barraud, G. Audoit, et al.. Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives. <i>Scripta Materialia</i>, 2018, 148, pp.91 - 97. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.scriptamat.2017.05.012\">⟨10.1016/j.scriptamat.2017.05.012⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-01765929v1\">⟨hal-01765929⟩</a>",
"title_s":["Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives"],
"authFullName_s":["J. Barnes","A. Grenier","I. Mouton","S. Barraud","G. Audoit","J. Bogdanowicz","C. Fleischmann","D. Melkonyan","W. Vandervorst","Sébastien Duguay","Nicolas Rolland","François Vurpillot","D. Blavette"],
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"citationRef_s":"<i>Journal of Physics D: Applied Physics</i>, 2018, 51 (10), pp.105601. <a target=\"_blank\" href=\"https://dx.doi.org/10.1088/1361-6463/aaaba6\">⟨10.1088/1361-6463/aaaba6⟩</a>",
"citationFull_s":"Shyam Katnagallu, Michal Dagan, Stefan Parviainen, Ali Nematollahi, Blazej Grabowski, et al.. Impact of local electrostatic field rearrangement on field ionization. <i>Journal of Physics D: Applied Physics</i>, 2018, 51 (10), pp.105601. <a target=\"_blank\" href=\"https://dx.doi.org/10.1088/1361-6463/aaaba6\">⟨10.1088/1361-6463/aaaba6⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-02107446v1\">⟨hal-02107446⟩</a>",
"title_s":["Impact of local electrostatic field rearrangement on field ionization"],
"authFullName_s":["Shyam Katnagallu","Michal Dagan","Stefan Parviainen","Ali Nematollahi","Blazej Grabowski","Paul Bagot","Nicolas Rolland","Jörg Neugebauer","Dierk Raabe","François Vurpillot","Michael Moody","Baptiste Gault"],
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"citationRef_s":"<i>Microscopy and Microanalysis</i>, 2017, 23 (S1), pp.640-641. <a target=\"_blank\" href=\"https://dx.doi.org/10.1017/S1431927617003865\">⟨10.1017/S1431927617003865⟩</a>",
"citationFull_s":"François Vurpillot, David Zanuttini, Stefan Parviainen, Baishaikhi Mazumder, Nicolas Rolland, et al.. Reconstructing APT Datasets: Challenging the Limits of the Possible. <i>Microscopy and Microanalysis</i>, 2017, 23 (S1), pp.640-641. <a target=\"_blank\" href=\"https://dx.doi.org/10.1017/S1431927617003865\">⟨10.1017/S1431927617003865⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-02107482v1\">⟨hal-02107482⟩</a>",
"title_s":["Reconstructing APT Datasets: Challenging the Limits of the Possible"],
"authFullName_s":["François Vurpillot","David Zanuttini","Stefan Parviainen","Baishaikhi Mazumder","Nicolas Rolland","Constantinos Hatzoglou","James Speck"],
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"citationRef_s":"<i>Microscopy and Microanalysis</i>, 2017, 23 (02), pp.247 - 254. <a target=\"_blank\" href=\"https://dx.doi.org/10.1017/s1431927617000253\">⟨10.1017/s1431927617000253⟩</a>",
"citationFull_s":"Nicolas Rolland, François Vurpillot, Sébastien Duguay, Baishakhi Mazumder, James Speck, et al.. New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint. <i>Microscopy and Microanalysis</i>, 2017, 23 (02), pp.247 - 254. <a target=\"_blank\" href=\"https://dx.doi.org/10.1017/s1431927617000253\">⟨10.1017/s1431927617000253⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-01766098v1\">⟨hal-01766098⟩</a>",
"title_s":["New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint"],
"authFullName_s":["Nicolas Rolland","François Vurpillot","Sébastien Duguay","Baishakhi Mazumder","James Speck","Didier Blavette"],
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"citationRef_s":"<i>European Microscopy Congress</i>, Aug 2016, Lyon, France. pp.775-776, <a target=\"_blank\" href=\"https://dx.doi.org/10.1002/9783527808465.EMC2016.8364\">⟨10.1002/9783527808465.EMC2016.8364⟩</a>",
"citationFull_s":"Williams Lefebvre, Florian Moyon, Antoine Normand, Nicolas Rolland, Ivan Blum, et al.. Correlative Investigations by HAADF-STEM and Atom Probe Tomography. <i>European Microscopy Congress</i>, Aug 2016, Lyon, France. pp.775-776, <a target=\"_blank\" href=\"https://dx.doi.org/10.1002/9783527808465.EMC2016.8364\">⟨10.1002/9783527808465.EMC2016.8364⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-01954243v1\">⟨hal-01954243⟩</a>",
"title_s":["Correlative Investigations by HAADF-STEM and Atom Probe Tomography"],
"authFullName_s":["Williams Lefebvre","Florian Moyon","Antoine Normand","Nicolas Rolland","Ivan Blum","Auriane Etienne","Celia Castro","Fabien Cuvilly","Lorenzo Mancini","Isabelle Mouton","Lorenzo Rigutti","François Vurpillot"],
"halId_s":"hal-01954243",
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"producedDateY_i":2016
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"citationRef_s":"<i>Semiconductor Science and Technology</i>, 2016, 31 (7), pp.074002. <a target=\"_blank\" href=\"https://dx.doi.org/10.1088/0268-1242/31/7/074002\">⟨10.1088/0268-1242/31/7/074002⟩</a>",
"citationFull_s":"François Vurpillot, Nicolas Rolland, Robert Estivill, Sébastien Duguay, D. Blavette. Accuracy of analyses of microelectronics nanostructures in atom probe tomography. <i>Semiconductor Science and Technology</i>, 2016, 31 (7), pp.074002. <a target=\"_blank\" href=\"https://dx.doi.org/10.1088/0268-1242/31/7/074002\">⟨10.1088/0268-1242/31/7/074002⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-01928850v1\">⟨hal-01928850⟩</a>",
"title_s":["Accuracy of analyses of microelectronics nanostructures in atom probe tomography"],
"authFullName_s":["François Vurpillot","Nicolas Rolland","Robert Estivill","Sébastien Duguay","D. Blavette"],
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"citationRef_s":"<i>Microscopy and Microanalysis</i>, 2015, 21 (6), pp.1649-1656. <a target=\"_blank\" href=\"https://dx.doi.org/10.1017/S1431927615015184\">⟨10.1017/S1431927615015184⟩</a>",
"citationFull_s":"Nicolas Rolland, François Vurpillot, Sébastien Duguay, Didier Blavette. A Meshless Algorithm to Model Field Evaporation in Atom Probe Tomography. <i>Microscopy and Microanalysis</i>, 2015, 21 (6), pp.1649-1656. <a target=\"_blank\" href=\"https://dx.doi.org/10.1017/S1431927615015184\">⟨10.1017/S1431927615015184⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-02107013v1\">⟨hal-02107013⟩</a>",
"title_s":["A Meshless Algorithm to Model Field Evaporation in Atom Probe Tomography"],
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"citationRef_s":"<i>European Physical Journal: Applied Physics</i>, 2015, 72 (2), pp.21001. <a target=\"_blank\" href=\"https://dx.doi.org/10.1051/epjap/2015150233\">⟨10.1051/epjap/2015150233⟩</a>",
"citationFull_s":"Nicolas Rolland, François Vurpillot, Sébastien Duguay, Didier Blavette. Dynamic evolution and fracture of multilayer field emitters in atom probe tomography: a new interpretation. <i>European Physical Journal: Applied Physics</i>, 2015, 72 (2), pp.21001. <a target=\"_blank\" href=\"https://dx.doi.org/10.1051/epjap/2015150233\">⟨10.1051/epjap/2015150233⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-02107622v1\">⟨hal-02107622⟩</a>",
"title_s":["Dynamic evolution and fracture of multilayer field emitters in atom probe tomography: a new interpretation"],
"authFullName_s":["Nicolas Rolland","François Vurpillot","Sébastien Duguay","Didier Blavette"],
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"citationRef_s":"<i>Ultramicroscopy</i>, 2015, 159, pp.195--201. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.ultramic.2015.03.010\">⟨10.1016/j.ultramic.2015.03.010⟩</a>",
"citationFull_s":"Nicolas Rolland, D. J. Larson, B. P. Geiser, Sébastien Duguay, François Vurpillot, et al.. An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials. <i>Ultramicroscopy</i>, 2015, 159, pp.195--201. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.ultramic.2015.03.010\">⟨10.1016/j.ultramic.2015.03.010⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-01928854v1\">⟨hal-01928854⟩</a>",
"title_s":["An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials"],
"authFullName_s":["Nicolas Rolland","D. J. Larson","B. P. Geiser","Sébastien Duguay","François Vurpillot","D. Blavette"],
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"citationRef_s":"<i>Applied Physics Letters</i>, 2015, 106 (21), pp.213102. <a target=\"_blank\" href=\"https://dx.doi.org/10.1063/1.4921352\">⟨10.1063/1.4921352⟩</a>",
"citationFull_s":"A. Grenier, Sébastien Duguay, J. P. Barnes, R. Serra, Nicolas Rolland, et al.. Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques. <i>Applied Physics Letters</i>, 2015, 106 (21), pp.213102. <a target=\"_blank\" href=\"https://dx.doi.org/10.1063/1.4921352\">⟨10.1063/1.4921352⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-01928856v1\">⟨hal-01928856⟩</a>",
"title_s":["Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques"],
"authFullName_s":["A. Grenier","Sébastien Duguay","J. P. Barnes","R. Serra","Nicolas Rolland","G. Audoit","P. Morin","P. Gouraud","D. Cooper","D. Blavette","François Vurpillot"],
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