Nicolas Rolland

Maître de conférences CNU : SECTION 32 - CHIMIE ORGANIQUE, MINERALE, INDUSTRIELLE

UMR 8181 - UNITE DE CATALYSE ET DE CHIMIE DU SOLIDE

Publications

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Grain size effect on interfacial segregation in nanomaterials. Journal of Physics and Chemistry of Solids, 2022, 164, pp.110620. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.jpcs.2022.110620\">⟨10.1016/j.jpcs.2022.110620⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-03855610v1\">⟨hal-03855610⟩</a>", "title_s":["Grain size effect on interfacial segregation in nanomaterials"], "authFullName_s":["F. Danoix","K. Hoummada","P. Maugis","N. Rolland","C. Debreux","Didier Blavette"], "halId_s":"hal-03855610", "docType_s":"ART", "producedDateY_i":2022 },{ "citationRef_s":"Computer Physics Communications, 2020, pp.107317. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.cpc.2020.107317\">⟨10.1016/j.cpc.2020.107317⟩</a>", "citationFull_s":"Benjamin Klaes, Rodrigue Lardé, Fabien Delaroche, Stefan Parviainen, Nicolas Rolland, et al.. A model to predict image formation in the three-dimensional field ion microscope. Computer Physics Communications, 2020, pp.107317. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.cpc.2020.107317\">⟨10.1016/j.cpc.2020.107317⟩</a>. <a target=\"_blank\" href=\"https://normandie-univ.hal.science/hal-02571970v1\">⟨hal-02571970⟩</a>", "title_s":["A model to predict image formation in the three-dimensional field ion microscope"], "authFullName_s":["Benjamin Klaes","Rodrigue Lardé","Fabien Delaroche","Stefan Parviainen","Nicolas Rolland","Shyam Katnagallu","Baptiste Gault","François Vurpillot"], "halId_s":"hal-02571970", "docType_s":"ART", "producedDateY_i":2020 },{ "citationRef_s":"Scripta Materialia, 2018, 148, pp.91 - 97. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.scriptamat.2017.05.012\">⟨10.1016/j.scriptamat.2017.05.012⟩</a>", "citationFull_s":"J. Barnes, A. Grenier, I. Mouton, S. Barraud, G. Audoit, et al.. Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives. Scripta Materialia, 2018, 148, pp.91 - 97. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.scriptamat.2017.05.012\">⟨10.1016/j.scriptamat.2017.05.012⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-01765929v1\">⟨hal-01765929⟩</a>", "title_s":["Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives"], "authFullName_s":["J. Barnes","A. Grenier","I. Mouton","S. Barraud","G. Audoit","J. Bogdanowicz","C. Fleischmann","D. Melkonyan","W. Vandervorst","Sébastien Duguay","Nicolas Rolland","François Vurpillot","D. Blavette"], "halId_s":"hal-01765929", "docType_s":"ART", "producedDateY_i":2018 },{ "citationRef_s":"Journal of Physics D: Applied Physics, 2018, 51 (10), pp.105601. <a target=\"_blank\" href=\"https://dx.doi.org/10.1088/1361-6463/aaaba6\">⟨10.1088/1361-6463/aaaba6⟩</a>", "citationFull_s":"Shyam Katnagallu, Michal Dagan, Stefan Parviainen, Ali Nematollahi, Blazej Grabowski, et al.. Impact of local electrostatic field rearrangement on field ionization. Journal of Physics D: Applied Physics, 2018, 51 (10), pp.105601. <a target=\"_blank\" href=\"https://dx.doi.org/10.1088/1361-6463/aaaba6\">⟨10.1088/1361-6463/aaaba6⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-02107446v1\">⟨hal-02107446⟩</a>", "title_s":["Impact of local electrostatic field rearrangement on field ionization"], "authFullName_s":["Shyam Katnagallu","Michal Dagan","Stefan Parviainen","Ali Nematollahi","Blazej Grabowski","Paul Bagot","Nicolas Rolland","Jörg Neugebauer","Dierk Raabe","François Vurpillot","Michael Moody","Baptiste Gault"], "halId_s":"hal-02107446", "docType_s":"ART", "producedDateY_i":2018 },{ "citationRef_s":"Microscopy and Microanalysis, 2017, 23 (S1), pp.640-641. <a target=\"_blank\" href=\"https://dx.doi.org/10.1017/S1431927617003865\">⟨10.1017/S1431927617003865⟩</a>", "citationFull_s":"François Vurpillot, David Zanuttini, Stefan Parviainen, Baishaikhi Mazumder, Nicolas Rolland, et al.. Reconstructing APT Datasets: Challenging the Limits of the Possible. Microscopy and Microanalysis, 2017, 23 (S1), pp.640-641. <a target=\"_blank\" href=\"https://dx.doi.org/10.1017/S1431927617003865\">⟨10.1017/S1431927617003865⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-02107482v1\">⟨hal-02107482⟩</a>", "title_s":["Reconstructing APT Datasets: Challenging the Limits of the Possible"], "authFullName_s":["François Vurpillot","David Zanuttini","Stefan Parviainen","Baishaikhi Mazumder","Nicolas Rolland","Constantinos Hatzoglou","James Speck"], "halId_s":"hal-02107482", "docType_s":"ART", "producedDateY_i":2017 },{ "citationRef_s":"Microscopy and Microanalysis, 2017, 23 (02), pp.247 - 254. <a target=\"_blank\" href=\"https://dx.doi.org/10.1017/s1431927617000253\">⟨10.1017/s1431927617000253⟩</a>", "citationFull_s":"Nicolas Rolland, François Vurpillot, Sébastien Duguay, Baishakhi Mazumder, James Speck, et al.. New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint. Microscopy and Microanalysis, 2017, 23 (02), pp.247 - 254. <a target=\"_blank\" href=\"https://dx.doi.org/10.1017/s1431927617000253\">⟨10.1017/s1431927617000253⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-01766098v1\">⟨hal-01766098⟩</a>", "title_s":["New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint"], "authFullName_s":["Nicolas Rolland","François Vurpillot","Sébastien Duguay","Baishakhi Mazumder","James Speck","Didier Blavette"], "halId_s":"hal-01766098", "docType_s":"ART", "producedDateY_i":2017 },{ "citationRef_s":"European Microscopy Congress, Aug 2016, Lyon, France. pp.775-776, <a target=\"_blank\" href=\"https://dx.doi.org/10.1002/9783527808465.EMC2016.8364\">⟨10.1002/9783527808465.EMC2016.8364⟩</a>", "citationFull_s":"Williams Lefebvre, Florian Moyon, Antoine Normand, Nicolas Rolland, Ivan Blum, et al.. Correlative Investigations by HAADF-STEM and Atom Probe Tomography. European Microscopy Congress, Aug 2016, Lyon, France. pp.775-776, <a target=\"_blank\" href=\"https://dx.doi.org/10.1002/9783527808465.EMC2016.8364\">⟨10.1002/9783527808465.EMC2016.8364⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-01954243v1\">⟨hal-01954243⟩</a>", "title_s":["Correlative Investigations by HAADF-STEM and Atom Probe Tomography"], "authFullName_s":["Williams Lefebvre","Florian Moyon","Antoine Normand","Nicolas Rolland","Ivan Blum","Auriane Etienne","Celia Castro","Fabien Cuvilly","Lorenzo Mancini","Isabelle Mouton","Lorenzo Rigutti","François Vurpillot"], "halId_s":"hal-01954243", "docType_s":"COMM", "producedDateY_i":2016 },{ "citationRef_s":"Semiconductor Science and Technology, 2016, 31 (7), pp.074002. <a target=\"_blank\" href=\"https://dx.doi.org/10.1088/0268-1242/31/7/074002\">⟨10.1088/0268-1242/31/7/074002⟩</a>", "citationFull_s":"François Vurpillot, Nicolas Rolland, Robert Estivill, Sébastien Duguay, D. Blavette. Accuracy of analyses of microelectronics nanostructures in atom probe tomography. Semiconductor Science and Technology, 2016, 31 (7), pp.074002. <a target=\"_blank\" href=\"https://dx.doi.org/10.1088/0268-1242/31/7/074002\">⟨10.1088/0268-1242/31/7/074002⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-01928850v1\">⟨hal-01928850⟩</a>", "title_s":["Accuracy of analyses of microelectronics nanostructures in atom probe tomography"], "authFullName_s":["François Vurpillot","Nicolas Rolland","Robert Estivill","Sébastien Duguay","D. Blavette"], "halId_s":"hal-01928850", "docType_s":"ART", "producedDateY_i":2016 },{ "citationRef_s":"Microscopy and Microanalysis, 2015, 21 (6), pp.1649-1656. <a target=\"_blank\" href=\"https://dx.doi.org/10.1017/S1431927615015184\">⟨10.1017/S1431927615015184⟩</a>", "citationFull_s":"Nicolas Rolland, François Vurpillot, Sébastien Duguay, Didier Blavette. A Meshless Algorithm to Model Field Evaporation in Atom Probe Tomography. Microscopy and Microanalysis, 2015, 21 (6), pp.1649-1656. <a target=\"_blank\" href=\"https://dx.doi.org/10.1017/S1431927615015184\">⟨10.1017/S1431927615015184⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-02107013v1\">⟨hal-02107013⟩</a>", "title_s":["A Meshless Algorithm to Model Field Evaporation in Atom Probe Tomography"], "authFullName_s":["Nicolas Rolland","François Vurpillot","Sébastien Duguay","Didier Blavette"], "halId_s":"hal-02107013", "docType_s":"ART", "producedDateY_i":2015 },{ "citationRef_s":"European Physical Journal: Applied Physics, 2015, 72 (2), pp.21001. <a target=\"_blank\" href=\"https://dx.doi.org/10.1051/epjap/2015150233\">⟨10.1051/epjap/2015150233⟩</a>", "citationFull_s":"Nicolas Rolland, François Vurpillot, Sébastien Duguay, Didier Blavette. Dynamic evolution and fracture of multilayer field emitters in atom probe tomography: a new interpretation. European Physical Journal: Applied Physics, 2015, 72 (2), pp.21001. <a target=\"_blank\" href=\"https://dx.doi.org/10.1051/epjap/2015150233\">⟨10.1051/epjap/2015150233⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-02107622v1\">⟨hal-02107622⟩</a>", "title_s":["Dynamic evolution and fracture of multilayer field emitters in atom probe tomography: a new interpretation"], "authFullName_s":["Nicolas Rolland","François Vurpillot","Sébastien Duguay","Didier Blavette"], "halId_s":"hal-02107622", "docType_s":"ART", "producedDateY_i":2015 },{ "citationRef_s":"Ultramicroscopy, 2015, 159, pp.195--201. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.ultramic.2015.03.010\">⟨10.1016/j.ultramic.2015.03.010⟩</a>", "citationFull_s":"Nicolas Rolland, D. J. Larson, B. P. Geiser, Sébastien Duguay, François Vurpillot, et al.. An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials. Ultramicroscopy, 2015, 159, pp.195--201. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.ultramic.2015.03.010\">⟨10.1016/j.ultramic.2015.03.010⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-01928854v1\">⟨hal-01928854⟩</a>", "title_s":["An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials"], "authFullName_s":["Nicolas Rolland","D. J. Larson","B. P. Geiser","Sébastien Duguay","François Vurpillot","D. Blavette"], "halId_s":"hal-01928854", "docType_s":"ART", "producedDateY_i":2015 },{ "citationRef_s":"Applied Physics Letters, 2015, 106 (21), pp.213102. <a target=\"_blank\" href=\"https://dx.doi.org/10.1063/1.4921352\">⟨10.1063/1.4921352⟩</a>", "citationFull_s":"A. Grenier, Sébastien Duguay, J. P. Barnes, R. Serra, Nicolas Rolland, et al.. Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques. Applied Physics Letters, 2015, 106 (21), pp.213102. <a target=\"_blank\" href=\"https://dx.doi.org/10.1063/1.4921352\">⟨10.1063/1.4921352⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-01928856v1\">⟨hal-01928856⟩</a>", "title_s":["Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques"], "authFullName_s":["A. Grenier","Sébastien Duguay","J. P. Barnes","R. Serra","Nicolas Rolland","G. Audoit","P. Morin","P. Gouraud","D. Cooper","D. Blavette","François Vurpillot"], "halId_s":"hal-01928856", "docType_s":"ART", "producedDateY_i":2015 }] } }

hal-04187762

Daniel Medina-Lopez, Thomas Liu, Silvio Osella, Hugo Levy-Falk, Nicolas Rolland, Christine Elias, Gaspard Huber, Pranav Ticku, Loïc Rondin, Bruno Jousselme, David Beljonne, Jean-Sébastien Lauret, Stephane Campidelli

Interplay of structure and photophysics of individualized rod-shaped graphene quantum dots with up to 132 sp² carbon atoms

Nature Communications, 2023, 14, pp.4728. ⟨10.1038/s41467-023-40376-w⟩

hal-03855610

F. Danoix, K. Hoummada, P. Maugis, N. Rolland, C. Debreux, Didier Blavette

Grain size effect on interfacial segregation in nanomaterials

Journal of Physics and Chemistry of Solids, 2022, 164, pp.110620. ⟨10.1016/j.jpcs.2022.110620⟩

hal-02571970

Benjamin Klaes, Rodrigue Lardé, Fabien Delaroche, Stefan Parviainen, Nicolas Rolland, Shyam Katnagallu, Baptiste Gault, François Vurpillot

A model to predict image formation in the three-dimensional field ion microscope

Computer Physics Communications, 2020, pp.107317. ⟨10.1016/j.cpc.2020.107317⟩

hal-01765929

J. Barnes, A. Grenier, I. Mouton, S. Barraud, G. Audoit, J. Bogdanowicz, C. Fleischmann, D. Melkonyan, W. Vandervorst, Sébastien Duguay, Nicolas Rolland, François Vurpillot, D. Blavette

Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives

Scripta Materialia, 2018, 148, pp.91 - 97. ⟨10.1016/j.scriptamat.2017.05.012⟩

hal-02107446

Shyam Katnagallu, Michal Dagan, Stefan Parviainen, Ali Nematollahi, Blazej Grabowski, Paul Bagot, Nicolas Rolland, Jörg Neugebauer, Dierk Raabe, François Vurpillot, Michael Moody, Baptiste Gault

Impact of local electrostatic field rearrangement on field ionization

Journal of Physics D: Applied Physics, 2018, 51 (10), pp.105601. ⟨10.1088/1361-6463/aaaba6⟩

hal-02107482

François Vurpillot, David Zanuttini, Stefan Parviainen, Baishaikhi Mazumder, Nicolas Rolland, Constantinos Hatzoglou, James Speck

Reconstructing APT Datasets: Challenging the Limits of the Possible

Microscopy and Microanalysis, 2017, 23 (S1), pp.640-641. ⟨10.1017/S1431927617003865⟩

hal-01766098

Nicolas Rolland, François Vurpillot, Sébastien Duguay, Baishakhi Mazumder, James Speck, Didier Blavette

New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint

Microscopy and Microanalysis, 2017, 23 (02), pp.247 - 254. ⟨10.1017/s1431927617000253⟩

hal-01954243

Williams Lefebvre, Florian Moyon, Antoine Normand, Nicolas Rolland, Ivan Blum, Auriane Etienne, Celia Castro, Fabien Cuvilly, Lorenzo Mancini, Isabelle Mouton, Lorenzo Rigutti, François Vurpillot

Correlative Investigations by HAADF-STEM and Atom Probe Tomography

European Microscopy Congress, Aug 2016, Lyon, France. pp.775-776, ⟨10.1002/9783527808465.EMC2016.8364⟩

hal-01928850

François Vurpillot, Nicolas Rolland, Robert Estivill, Sébastien Duguay, D. Blavette

Accuracy of analyses of microelectronics nanostructures in atom probe tomography

Semiconductor Science and Technology, 2016, 31 (7), pp.074002. ⟨10.1088/0268-1242/31/7/074002⟩

hal-02107013

Nicolas Rolland, François Vurpillot, Sébastien Duguay, Didier Blavette

A Meshless Algorithm to Model Field Evaporation in Atom Probe Tomography

Microscopy and Microanalysis, 2015, 21 (6), pp.1649-1656. ⟨10.1017/S1431927615015184⟩

hal-02107622

Nicolas Rolland, François Vurpillot, Sébastien Duguay, Didier Blavette

Dynamic evolution and fracture of multilayer field emitters in atom probe tomography: a new interpretation

European Physical Journal: Applied Physics, 2015, 72 (2), pp.21001. ⟨10.1051/epjap/2015150233⟩

hal-01928854

Nicolas Rolland, D. J. Larson, B. P. Geiser, Sébastien Duguay, François Vurpillot, D. Blavette

An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials

Ultramicroscopy, 2015, 159, pp.195--201. ⟨10.1016/j.ultramic.2015.03.010⟩

hal-01928856

A. Grenier, Sébastien Duguay, J. P. Barnes, R. Serra, Nicolas Rolland, G. Audoit, P. Morin, P. Gouraud, D. Cooper, D. Blavette, François Vurpillot

Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques

Applied Physics Letters, 2015, 106 (21), pp.213102. ⟨10.1063/1.4921352⟩

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Nicolas Rolland

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