Nicolas Rolland
Maître de conférences
CNU : SECTION 32 - CHIMIE ORGANIQUE, MINERALE, INDUSTRIELLE
Laboratoire / équipe
Publications
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"citationRef_s":"<i>Nature Communications</i>, 2023, 14, pp.4728. <a target=\"_blank\" href=\"https://dx.doi.org/10.1038/s41467-023-40376-w\">⟨10.1038/s41467-023-40376-w⟩</a>",
"citationFull_s":"Daniel Medina-Lopez, Thomas Liu, Silvio Osella, Hugo Levy-Falk, Nicolas Rolland, et al.. Interplay of structure and photophysics of individualized rod-shaped graphene quantum dots with up to 132 sp² carbon atoms. <i>Nature Communications</i>, 2023, 14, pp.4728. <a target=\"_blank\" href=\"https://dx.doi.org/10.1038/s41467-023-40376-w\">⟨10.1038/s41467-023-40376-w⟩</a>. <a target=\"_blank\" href=\"https://cnrs.hal.science/hal-04187762\">⟨hal-04187762⟩</a>",
"title_s":["Interplay of structure and photophysics of individualized rod-shaped graphene quantum dots with up to 132 sp² carbon atoms"],
"authFullName_s":["Daniel Medina-Lopez",
"Thomas Liu",
"Silvio Osella",
"Hugo Levy-Falk",
"Nicolas Rolland",
"Christine Elias",
"Gaspard Huber",
"Pranav Ticku",
"Loïc Rondin",
"Bruno Jousselme",
"David Beljonne",
"Jean-Sébastien Lauret",
"Stephane Campidelli"],
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"citationRef_s":"<i>Journal of Physics and Chemistry of Solids</i>, 2022, 164, pp.110620. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.jpcs.2022.110620\">⟨10.1016/j.jpcs.2022.110620⟩</a>",
"citationFull_s":"F. Danoix, K. Hoummada, P. Maugis, N. Rolland, C. Debreux, et al.. Grain size effect on interfacial segregation in nanomaterials. <i>Journal of Physics and Chemistry of Solids</i>, 2022, 164, pp.110620. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.jpcs.2022.110620\">⟨10.1016/j.jpcs.2022.110620⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-03855610\">⟨hal-03855610⟩</a>",
"title_s":["Grain size effect on interfacial segregation in nanomaterials"],
"authFullName_s":["F. Danoix",
"K. Hoummada",
"P. Maugis",
"N. Rolland",
"C. Debreux",
"Didier Blavette"],
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"producedDateY_i":2022},
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"citationRef_s":"<i>Computer Physics Communications</i>, 2020, pp.107317. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.cpc.2020.107317\">⟨10.1016/j.cpc.2020.107317⟩</a>",
"citationFull_s":"Benjamin Klaes, Rodrigue Lardé, Fabien Delaroche, Stefan Parviainen, Nicolas Rolland, et al.. A model to predict image formation in the three-dimensional field ion microscope. <i>Computer Physics Communications</i>, 2020, pp.107317. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.cpc.2020.107317\">⟨10.1016/j.cpc.2020.107317⟩</a>. <a target=\"_blank\" href=\"https://normandie-univ.hal.science/hal-02571970\">⟨hal-02571970⟩</a>",
"title_s":["A model to predict image formation in the three-dimensional field ion microscope"],
"authFullName_s":["Benjamin Klaes",
"Rodrigue Lardé",
"Fabien Delaroche",
"Stefan Parviainen",
"Nicolas Rolland",
"Shyam Katnagallu",
"Baptiste Gault",
"François Vurpillot"],
"halId_s":"hal-02571970",
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"producedDateY_i":2020},
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"citationRef_s":"<i>Scripta Materialia</i>, 2018, 148, pp.91 - 97. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.scriptamat.2017.05.012\">⟨10.1016/j.scriptamat.2017.05.012⟩</a>",
"citationFull_s":"J. Barnes, A. Grenier, I. Mouton, S. Barraud, G. Audoit, et al.. Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives. <i>Scripta Materialia</i>, 2018, 148, pp.91 - 97. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.scriptamat.2017.05.012\">⟨10.1016/j.scriptamat.2017.05.012⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-01765929\">⟨hal-01765929⟩</a>",
"title_s":["Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives"],
"authFullName_s":["J. Barnes",
"A. Grenier",
"I. Mouton",
"S. Barraud",
"G. Audoit",
"J. Bogdanowicz",
"C. Fleischmann",
"D. Melkonyan",
"W. Vandervorst",
"Sébastien Duguay",
"Nicolas Rolland",
"François Vurpillot",
"D. Blavette"],
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"producedDateY_i":2018},
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"citationRef_s":"<i>Journal of Physics D: Applied Physics</i>, 2018, 51 (10), pp.105601. <a target=\"_blank\" href=\"https://dx.doi.org/10.1088/1361-6463/aaaba6\">⟨10.1088/1361-6463/aaaba6⟩</a>",
"citationFull_s":"Shyam Katnagallu, Michal Dagan, Stefan Parviainen, Ali Nematollahi, Blazej Grabowski, et al.. Impact of local electrostatic field rearrangement on field ionization. <i>Journal of Physics D: Applied Physics</i>, 2018, 51 (10), pp.105601. <a target=\"_blank\" href=\"https://dx.doi.org/10.1088/1361-6463/aaaba6\">⟨10.1088/1361-6463/aaaba6⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-02107446\">⟨hal-02107446⟩</a>",
"title_s":["Impact of local electrostatic field rearrangement on field ionization"],
"authFullName_s":["Shyam Katnagallu",
"Michal Dagan",
"Stefan Parviainen",
"Ali Nematollahi",
"Blazej Grabowski",
"Paul Bagot",
"Nicolas Rolland",
"Jörg Neugebauer",
"Dierk Raabe",
"François Vurpillot",
"Michael Moody",
"Baptiste Gault"],
"halId_s":"hal-02107446",
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"producedDateY_i":2018},
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"citationRef_s":"<i>Microscopy and Microanalysis</i>, 2017, 23 (S1), pp.640-641. <a target=\"_blank\" href=\"https://dx.doi.org/10.1017/S1431927617003865\">⟨10.1017/S1431927617003865⟩</a>",
"citationFull_s":"François Vurpillot, David Zanuttini, Stefan Parviainen, Baishaikhi Mazumder, Nicolas Rolland, et al.. Reconstructing APT Datasets: Challenging the Limits of the Possible. <i>Microscopy and Microanalysis</i>, 2017, 23 (S1), pp.640-641. <a target=\"_blank\" href=\"https://dx.doi.org/10.1017/S1431927617003865\">⟨10.1017/S1431927617003865⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-02107482\">⟨hal-02107482⟩</a>",
"title_s":["Reconstructing APT Datasets: Challenging the Limits of the Possible"],
"authFullName_s":["François Vurpillot",
"David Zanuttini",
"Stefan Parviainen",
"Baishaikhi Mazumder",
"Nicolas Rolland",
"Constantinos Hatzoglou",
"James Speck"],
"halId_s":"hal-02107482",
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"producedDateY_i":2017},
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"citationRef_s":"<i>Microscopy and Microanalysis</i>, 2017, 23 (02), pp.247 - 254. <a target=\"_blank\" href=\"https://dx.doi.org/10.1017/s1431927617000253\">⟨10.1017/s1431927617000253⟩</a>",
"citationFull_s":"Nicolas Rolland, François Vurpillot, Sébastien Duguay, Baishakhi Mazumder, James Speck, et al.. New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint. <i>Microscopy and Microanalysis</i>, 2017, 23 (02), pp.247 - 254. <a target=\"_blank\" href=\"https://dx.doi.org/10.1017/s1431927617000253\">⟨10.1017/s1431927617000253⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-01766098\">⟨hal-01766098⟩</a>",
"title_s":["New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint"],
"authFullName_s":["Nicolas Rolland",
"François Vurpillot",
"Sébastien Duguay",
"Baishakhi Mazumder",
"James Speck",
"Didier Blavette"],
"halId_s":"hal-01766098",
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"producedDateY_i":2017},
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"citationRef_s":"<i>European Microscopy Congress</i>, Aug 2016, Lyon, France. pp.775-776, <a target=\"_blank\" href=\"https://dx.doi.org/10.1002/9783527808465.EMC2016.8364\">⟨10.1002/9783527808465.EMC2016.8364⟩</a>",
"citationFull_s":"Williams Lefebvre, Florian Moyon, Antoine Normand, Nicolas Rolland, Ivan Blum, et al.. Correlative Investigations by HAADF-STEM and Atom Probe Tomography. <i>European Microscopy Congress</i>, Aug 2016, Lyon, France. pp.775-776, <a target=\"_blank\" href=\"https://dx.doi.org/10.1002/9783527808465.EMC2016.8364\">⟨10.1002/9783527808465.EMC2016.8364⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-01954243\">⟨hal-01954243⟩</a>",
"title_s":["Correlative Investigations by HAADF-STEM and Atom Probe Tomography"],
"authFullName_s":["Williams Lefebvre",
"Florian Moyon",
"Antoine Normand",
"Nicolas Rolland",
"Ivan Blum",
"Auriane Etienne",
"Celia Castro",
"Fabien Cuvilly",
"Lorenzo Mancini",
"Isabelle Mouton",
"Lorenzo Rigutti",
"François Vurpillot"],
"halId_s":"hal-01954243",
"docType_s":"COMM",
"producedDateY_i":2016},
{
"citationRef_s":"<i>Semiconductor Science and Technology</i>, 2016, 31 (7), pp.074002. <a target=\"_blank\" href=\"https://dx.doi.org/10.1088/0268-1242/31/7/074002\">⟨10.1088/0268-1242/31/7/074002⟩</a>",
"citationFull_s":"François Vurpillot, Nicolas Rolland, Robert Estivill, Sébastien Duguay, D. Blavette. Accuracy of analyses of microelectronics nanostructures in atom probe tomography. <i>Semiconductor Science and Technology</i>, 2016, 31 (7), pp.074002. <a target=\"_blank\" href=\"https://dx.doi.org/10.1088/0268-1242/31/7/074002\">⟨10.1088/0268-1242/31/7/074002⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-01928850\">⟨hal-01928850⟩</a>",
"title_s":["Accuracy of analyses of microelectronics nanostructures in atom probe tomography"],
"authFullName_s":["François Vurpillot",
"Nicolas Rolland",
"Robert Estivill",
"Sébastien Duguay",
"D. Blavette"],
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"citationRef_s":"<i>Microscopy and Microanalysis</i>, 2015, 21 (6), pp.1649-1656. <a target=\"_blank\" href=\"https://dx.doi.org/10.1017/S1431927615015184\">⟨10.1017/S1431927615015184⟩</a>",
"citationFull_s":"Nicolas Rolland, François Vurpillot, Sébastien Duguay, Didier Blavette. A Meshless Algorithm to Model Field Evaporation in Atom Probe Tomography. <i>Microscopy and Microanalysis</i>, 2015, 21 (6), pp.1649-1656. <a target=\"_blank\" href=\"https://dx.doi.org/10.1017/S1431927615015184\">⟨10.1017/S1431927615015184⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-02107013\">⟨hal-02107013⟩</a>",
"title_s":["A Meshless Algorithm to Model Field Evaporation in Atom Probe Tomography"],
"authFullName_s":["Nicolas Rolland",
"François Vurpillot",
"Sébastien Duguay",
"Didier Blavette"],
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"citationRef_s":"<i>European Physical Journal: Applied Physics</i>, 2015, 72 (2), pp.21001. <a target=\"_blank\" href=\"https://dx.doi.org/10.1051/epjap/2015150233\">⟨10.1051/epjap/2015150233⟩</a>",
"citationFull_s":"Nicolas Rolland, François Vurpillot, Sébastien Duguay, Didier Blavette. Dynamic evolution and fracture of multilayer field emitters in atom probe tomography: a new interpretation. <i>European Physical Journal: Applied Physics</i>, 2015, 72 (2), pp.21001. <a target=\"_blank\" href=\"https://dx.doi.org/10.1051/epjap/2015150233\">⟨10.1051/epjap/2015150233⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-02107622\">⟨hal-02107622⟩</a>",
"title_s":["Dynamic evolution and fracture of multilayer field emitters in atom probe tomography: a new interpretation"],
"authFullName_s":["Nicolas Rolland",
"François Vurpillot",
"Sébastien Duguay",
"Didier Blavette"],
"halId_s":"hal-02107622",
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"citationRef_s":"<i>Applied Physics Letters</i>, 2015, 106 (21), pp.213102. <a target=\"_blank\" href=\"https://dx.doi.org/10.1063/1.4921352\">⟨10.1063/1.4921352⟩</a>",
"citationFull_s":"A. Grenier, Sébastien Duguay, J. P. Barnes, R. Serra, Nicolas Rolland, et al.. Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques. <i>Applied Physics Letters</i>, 2015, 106 (21), pp.213102. <a target=\"_blank\" href=\"https://dx.doi.org/10.1063/1.4921352\">⟨10.1063/1.4921352⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-01928856\">⟨hal-01928856⟩</a>",
"title_s":["Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques"],
"authFullName_s":["A. Grenier",
"Sébastien Duguay",
"J. P. Barnes",
"R. Serra",
"Nicolas Rolland",
"G. Audoit",
"P. Morin",
"P. Gouraud",
"D. Cooper",
"D. Blavette",
"François Vurpillot"],
"halId_s":"hal-01928856",
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"citationRef_s":"<i>Ultramicroscopy</i>, 2015, 159, pp.195--201. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.ultramic.2015.03.010\">⟨10.1016/j.ultramic.2015.03.010⟩</a>",
"citationFull_s":"Nicolas Rolland, D. J. Larson, B. P. Geiser, Sébastien Duguay, François Vurpillot, et al.. An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials. <i>Ultramicroscopy</i>, 2015, 159, pp.195--201. <a target=\"_blank\" href=\"https://dx.doi.org/10.1016/j.ultramic.2015.03.010\">⟨10.1016/j.ultramic.2015.03.010⟩</a>. <a target=\"_blank\" href=\"https://hal.science/hal-01928854\">⟨hal-01928854⟩</a>",
"title_s":["An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials"],
"authFullName_s":["Nicolas Rolland",
"D. J. Larson",
"B. P. Geiser",
"Sébastien Duguay",
"François Vurpillot",
"D. Blavette"],
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